Conductive Material Properties Analyzer

The RPT-II Conductive Material Properties Analyzer is designed for full performance analysis of conductive materials. It provides capabilities such as conductivity analysis, expansion coefficient analysis, and thermal conductivity analysis. The analyzer is multifunctional and widely used in scientific research and educational settings, suitable for testing physical properties of semiconductors, graphite motor materials, metallic materials, and non-metallic materials like glass ceramics.

The system includes several testing function modules, including expansion coefficient, conductivity, thermal conductivity, and resistivity. It operates over a testing temperature range from room temperature to 1000°C, with a precision of 0.1°C. The heating rate can be adjusted from 0 to 10°C per minute with options for natural and controlled cooling. Sample dimensions are accommodated in sizes such as ¢4*100mm, ¢8*100mm, and ¢6*100mm. Deformation measurement ranges from 0 to 5mm with an accuracy of 0.1% and resolution of 1μm/dig (or 0.1μm/dig). The analyzer operates with fully automatic software administered via an industrial PC.