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DRX-II-PS Transient Plane Source Thermal Conductivity Analyzer

Published: 3/31/2025

Transient Plane Source instrument for rapid measurement of thermal conductivity across solids, powders, films, coatings, liquids, and anisotropic materials. Suitable for R&D and quality control in power, automotive, materials science, and biopharma applications.

Product Description

The DRX-II-PS is a thermal conductivity analyzer based on the Transient Plane Source (TPS) method, enabling direct measurement of transient heat propagation within seconds. Unlike steady-state techniques, the TPS approach mitigates contact thermal resistance effects and requires only a relatively flat sample surface, minimizing sample preparation.

The system supports multiple test modules and probes to address a wide range of materials including metals, alloys, ceramics, ores, composites, silicon wafers, polymers, binders, paper, textiles, printed circuit boards, and propellants. Measurement control, data acquisition, and analysis are performed via dedicated PC software, providing reliable results for research and industrial quality assurance.

Technical Specifications

ParameterSpecification
Thermal Conductivity Range0.005–500 W/m·K
Temperature RangeAmbient to 200 ℃
Measurement MethodTransient Plane Source (TPS)
Accuracy±3%
Material CompatibilityMetals, alloys, ceramics, ores, composites, silicon wafers, polymers, binders, paper, textiles, printed circuit boards, propellants
Sample FormsSolids, powders, thin films, coatings, liquids, anisotropic materials
Test ModulesBasic, Thin Film, Flat Plate, Anisotropic, Single-Sided
Probe SizesΦ2–Φ30 mm; optional Φ50–Φ100 mm
Measurement TimeSeconds to minutes
Data Acquisition And AnalysisPC software
Standard ConfigurationMain unit (1), test software (1); computer required (user-supplied)

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