Laser Flash Thermal Conductivity Analyzer
Published: 1/6/2025
Laser flash method system for measuring thermal diffusivity, specific heat (via comparison), and calculating thermal conductivity of solids, liquids, melts, and slags. Suitable for metals, alloys, ceramics, graphite/carbon fiber, filled plastics, polymers, films, powders, and insulating materials, compliant with GJB 1201.1-91 and ASTM D1461.
Product Description
The DRX-II-JG is a modular laser flash thermal conductivity analyzer that irradiates a sample with a short laser pulse and records the rear-surface temperature rise using a high‑speed infrared detector. From the transient temperature response, the instrument computes thermal diffusivity; with specific heat determined by comparison to standards, it calculates thermal conductivity over selectable temperature ranges.
The platform supports multiple samples per run and interchangeable furnaces to cover broad temperature selections. Configurable sample holders accommodate bulk solids, low- and high‑viscosity liquids, melts, slags, powders, elastomers, and thin films, with options for vacuum and controlled atmospheres. Integrated software provides automated control, model fitting with pulse width/energy and heat‑loss corrections, database functions, reporting, and PC connectivity.
Technical Specifications
| Parameter | Specification |
|---|---|
| Measurement Principle | Laser flash (rear-surface IR detection) |
| Standards Compliance | GJB 1201.1-91; ASTM D1461 |
| Temperature Range Options | Ambient; RT–500 ℃; RT–1000 ℃ (interchangeable furnaces); selectable −125 to 2800 ℃ by furnace option |
| Heating/Cooling Rate | 0.1–30 ℃/min (settable) |
| Sample Capacity | 1, 3, or 6 samples (automatic autosampler optional) |
| Sample Size (Solids) | Square ≥ 10 × 10 mm; Round ≤ φ20 mm; Thickness 1–10 mm (special sizes on request) |
| Measurement Environments | Vacuum and protective atmospheres |
| Vacuum Level | −0.1 MPa (typical); 1.0 × 10⁻³ Pa (special build) |
| Atmospheres | Inert; oxidizing; reducing; static; dynamic |
| Thermal Diffusivity Range | 0.01–1000 mm²/s |
| Thermal Conductivity Range | 0.1–4000 W/(m·K) |
| Pulse Source | Nd:YAG laser |
| Pulse Energy | 15 J/pulse |
| Pulse Energy Adjustability | Yes |
| Pulse Interval Control | Software settable |
| IR Detector | InSb/MCT, air-cooled |
| Sample Types | Bulk solids; low-viscosity liquids; high-viscosity liquids; powders (with clamp set); viscous semi‑solids; elastomers; thin films |
| Sample Holders | Graphite; SiC; Al2O3; metals (custom options available) |
| Analysis Features | Multilayer contact thermal resistance analysis; calculation of thermal resistance and diffusivity; specific heat by comparison with standards; pulse width correction; pulse energy integration; heat‑loss correction; built‑in database |
| Data Acquisition Rate | Up to 2 MHz |
| PC Interface | USB and dedicated portable interface; optional Ethernet for data interconnection and remote testing |
| Software OS Support | Windows 10, 64‑bit |
| Repeatability (Cp) | ±3% (most materials) |
| Repeatability (Thermal Diffusivity) | ±2% (most materials) |
| System Design | Compact, modular; separated electronics; optional shielding for nuclear applications |
| Typical System Configuration | Test mainframe with high‑temperature furnace; autosampler; analysis software; PC |
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Contact Information
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B6-101, Zhongnan High-Tech Intelligent Manufacturing Industrial Park, No. 10 Shuangma Street, Yuetang District, Xiangtan City, Hunan Province, China
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