Laser Flash Method Thermal Conductivity Analyzer
Published: 4/11/2025
The Laser Flash Method Thermal Conductivity Analyzer utilizes a laser to irradiate the sample and an infrared detector to measure the back temperature rise, calculating the thermal diffusivity. It is widely used in the testing of metals, ceramics, graphite, and other materials.
Product Description
The Laser Flash Method Thermal Conductivity Analyzer uses a laser to irradiate the sample and an infrared detector to measure the temperature rise on the back surface, allowing calculation of the sample's thermal diffusivity and specific heat to further compute thermal conductivity. It is applicable in testing metals and alloys, diamonds, ceramics, graphite, carbon fibers, filled plastics, polymers, liquids, thin films, and solid insulating and powder materials, meeting standards GJB 1201.1-91 and ASTMD 1461.
Developed with modular design, the DRX-II-JG series laser thermal conductivity testers can measure thermal diffusivity, thermal conductivity, and specific heat for 3-6 samples simultaneously. The temperature range is selectable from -125 to 2800°C, and different sample holders can be used for solids, liquids, melts, and slags. Compact design separates hardware and electronics, making it adaptable for nuclear applications.
The measurement principle involves placing a sample in the furnace's automatic sampler, heating the furnace to a preset temperature, and using a xenon lamp to pulse energy to the sample bottom. The uniform temperature rise on the sample top is detected by a high-speed infrared detector, from which thermal diffusivity is calculated based on temperature rise vs. time data. This instrument allows for diverse applications including vacuum and protective atmosphere measurements, multiple contact heat resistance analysis, and automatic control via a computer.
Technical Specifications
| Parameter | Specification |
|---|---|
| Temperature Range | RT-500°C, 1000°C, 1600°C |
| Heating/Cooling Rate | 0.1–30°C/min |
| Sample Size Range | Square ≥ 10×10mm, Circle < φ20mm, Thickness 1–10mm |
| Sample Capacity Options | 1, 3, or 6 samples |
| Test Environment | Customizable vacuum and protective atmospheres |
| Thermal Diffusivity Range | 0.01–1000 mm²/s |
| Thermal Conductivity Range | 0.1–2000 W/m·K |
| Pulse Source | Nd:YAG Laser |
| Pulse Energy | 15 J/shot |
| Sensors | Insb/MCT, air-cooled |
| Sample Supports | Graphite, SiC, Al2O3, Metal (customizable) |
| Vacuum Capability | -0.1 MPa standard, 10-3 Pa customizable |
| Software Compatibility | WINDOWS10, 64-bit |
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B6-101, Zhongnan High-Tech Intelligent Manufacturing Industrial Park, No. 10 Shuangma Street, Yuetang District, Xiangtan City, Hunan Province, China

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