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High-Temperature Laser Thermal Conductivity Analyzer

Published: 6/18/2025

Laser flash analysis measures thermal diffusivity and calculates thermal conductivity and specific heat across a wide temperature range. The DRX-II-JG supports multi-sample testing and configurable atmospheres for metals, ceramics, polymers, carbon materials, powders, liquids, films, and slags.

Product Description

The DRX-II-JG is a modular laser flash thermal property analyzer designed to determine thermal diffusivity, thermal conductivity, and specific heat over configurable temperature ranges up to 1600°C with options extending down to −125°C or up to 2800°C by furnace replacement. It supports 1, 3, or 6 samples with an optional automatic feeder and multiple sample holders suited for solids, low- and high-viscosity liquids, melts, powders, films, and slags.

In operation, a short energy pulse (Nd:YAG) irradiates the sample bottom at a set temperature, producing a transient temperature rise on the top surface that is captured by a high-speed IR detector. Thermal diffusivity is computed from the temperature–time response; with known or comparative specific heat, thermal conductivity is derived. The system offers vacuum and controlled atmospheres (inert, oxidizing, reducing; static or dynamic), multi-layer contact resistance analysis, pulse-width/energy corrections, heat-loss corrections, and integrated data acquisition and analysis software.

Technical Specifications

ParameterSpecification
Measurement PrincipleLaser flash (pulse heating, IR detection)
StandardsGJB 1201.1-91; GB/T 22588-2008; ASTM D1461
Temperature Range OptionsRT–500°C; RT–1000°C; RT–1600°C (furnace configurable)
Extended Temperature Capability−125°C to 2800°C (by furnace replacement; selectable)
Heating/Cooling Rate0.1–30°C/min (settable)
Sample Size (Typical)Square ≥ 10 × 10 mm; Round ≤ φ20 mm; Thickness 1–10 mm (special sizes on request)
Sample Capacity1, 3, or 6 positions (automatic feeder optional)
Measurement EnvironmentsVacuum and protective atmospheres
Vacuum Level−0.1 MPa (standard); 1.0×10^−3 Pa (custom option)
AtmospheresInert, oxidizing, reducing (static/dynamic)
Thermal Diffusivity Range0.01–1000 mm²/s
Thermal Conductivity Range0.1–2000 W/m·K
Pulse SourceNd:YAG laser
Pulse Energy15 J/pulse
Pulse Energy AdjustabilityYes
Pulse IntervalSoftware configurable
IR DetectorInSb/MCT, air-cooled
Sample TypesSolid bulk, low-viscosity liquid, high-viscosity liquid, solid powder, viscous semi-solid, elastic solid, films
Sample HoldersGraphite; SiC; Al2O3; metal (others customizable); automatic feeder supplied
Analysis FeaturesMulti-layer/contact thermal resistance analysis; specific heat via comparative method using standards; pulse-width correction; pulse energy integration; heat-loss correction; built-in database
Data Acquisition RateUp to 2 MHz
Host InterfaceUSB and dedicated portable interface; optional Ethernet for data networking and remote testing
SoftwareDedicated analysis and control software; supports Windows 10 64-bit
Repeatability (Cp)±3% (most materials)
Repeatability (Thermal Diffusivity)±2 (unit per source; typical repeatability within ±2% for most materials)
System ArchitectureIntegrated electronics; separated hardware and electronics with optional shielding for nuclear-related applications
Typical ConfigurationTest host with high-temperature furnace, sample feeder, analysis software, branded PC

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